gonio'2pi gonioradiometer

With the gonio'2pi Gonioradiometer you can professionally and precisely measure light source and luminaire properties (near-field photogoniometer) as well as scattering behaviour (BSDF measurements) of materials and surfaces with very high measurement dynamics. The goniometer is available in a near-field configuration (si), a scattered light configuration (bsdf) and in a complete version for both applications. A later Gonioradiometer upgrade from si to bsdf or vice versa is easily possible. The spectrum of the unique gonio'2pi thus ranges from the smallest light sources to large luminaire systems as well as the Gonioradiospectrometer analysis of material properties.
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Necessity of Realistic Optical Simulations Based on Material Data
In modern optics development, the demand for increasingly realistic optical simulations continues to grow. To achieve this, the optical properties of the materials used must be precisely measured. This includes both surface and volume scattering, as these factors significantly impact the optical behavior of a material, affecting applications ranging from lighting technology to precise scientific instruments. The scattering of radiation or light at a surface or within a volume, based on reflection, refraction, and scattering, must be described. These properties can only be captured through detailed measurements that consider the complex interaction of light with the material.

4-Axis Gonioradiometer for complete Measurements
A complete and accurate measurement of scattering properties is only possible with a 4-axis gonioradiometer (anisotropy). This instrument allows the capture of scattering data in all relevant angles and directions, which is essential for realistic simulation.

Spectral Scattering Distribution
Depending on the application, the spectral scattering distribution is also measured. This provides information on how the material scatters light of different wavelengths and is particularly important for applications where color fidelity or color shading is significant.

Integration into Optical Simulation Programs
To effectively utilize the captured scattering data, it is crucial to export this data directly into common optical simulation programs such as Ansys Speos, Light Tools, and Zemax. This allows developers to seamlessly integrate realistic material properties into their simulation models, thereby improving the accuracy and realism of their designs. Consequently, the precise measurement and simulation of the optical properties of materials form the foundation for advanced optical developments and innovative solutions in lighting technology and optics.